Postdoc in Performance Characterization Technology of Integrated Circuit Materials

Time:2025-06-16

Recruitment Requirements

1. Ph.D students majoring in materials, microelectronics, surface chemistry and other related majors;

2. Fully understand the principles of material analysis methods and testing and characterization equipment, and have experience in the use of at least one type of testing equipment such as mass spectrometry, spectroscopy and other chemical analysis or microstructure characterization;

3. Familiar with the basic principles of integrated circuit technology and devices, understand the basic theories and technologies of thin film material growth or micro-nano processing technology, and have relevant scientific research or work experience in integrated circuits;

4. Experience in integrated circuit materials or process research and development is preferred.

Job Description

1. Conduct research and development on advanced characterization techniques for thin-film materials (especially surfaces and interfaces) used in integrated circuits;

2. Perform reliability testing (e.g., TDDB) of MOS devices and analyze and organize the resulting data;

3. Review scientific literature, including research papers;

4. Apply for patents (intellectual property of R&D achievements) and publish research papers;

5. Communicate with relevant departments to ensure the timely progress of research projects.

Contact Information

Yiying WANG, email: yywang@mail.sim.ac.cn