Materials Analysis Characterization
With the advancement of process technologies and materials, the requirements for the precision, accuracy, and repeatability of material analysis techniques are continuously and rapidly escalating. Taking wet electronic chemicals as an example, the detection limit for elemental impurities at the G5 grade is in the parts-per-trillion (ppt) range, while the development of G6-grade chemicals demands detection limits reaching the parts-per-quadrillion (ppq) level. Furthermore, new semiconductor materials and process materials encompass an extremely broad range, involving thousands of categories with significant variations among them, necessitating diverse and sophisticated advanced analytical characterization technologies.
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