With the advancement of process technologies and materials, the requirements for the precision, accuracy, and repeatability of material analysis techniques are continuously and rapidly escalating. Taking wet electronic chemicals as an example, the detection limit for elemental impurities at the G5 grade is in the parts-per-trillion (ppt) range, while the development of G6-grade chemicals demands detection limits reaching the parts-per-quadrillion (ppq) level. Furthermore, new semiconductor materials and process materials encompass an extremely broad range, involving thousands of categories with significant variations among them, necessitating diverse and sophisticated advanced analytical characterization technologies.

Our research group is dedicated to pioneering next-generation material innovations by developing and promoting advanced analytical characterization technologies. The main focus areas include:

1. Development of ultra-high-purity wet electronic chemical analysis technologies;

2. Development of trace organic component analysis technologies for formulated functional chemicals;

3. Development of AI-powered test spectrum interpretation technologies;

4. Development of quantitative calibration and computational simulation technologies for standard-free testing;

5. Development and application of cutting-edge analytical characterization equipment for extreme conditions.