论文
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High-Frequency Bulk Acoustic Wave Resonator with Ferromagnetic Electrodes for Magnetic Field SensingChuang Man, Hongsheng Zheng, Zhiqiang Mu, Yumeng Yang2025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands2025, pp. 1-4. https://doi.org/10.1109/IUS62464.2025.11201392 -
A Facile FBAR Design for Air Gap ReplacementChen Li, Ruidong Qin, Wentong Dou, Chongyang Huo, Bozuo Jing, Yiying Wang, Xuanqi Huang, Zhiqiang Mu, Wenjie Yu2025, pp. 1-3. https://doi.org/10.1109/IUS62464.2025.112013932025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands
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The Investigation of PFM Method for Characterization of Ultra-thin Piezoelectric FilmsChongyang Huo, Ruidong Qin, Wentong Dou, Chen Li, Bozuo Jing, Xuanqi Huang, Zhiqiang Mu, Wenjie Yu2025, pp. 1-3. https://doi.org/10.1109/IUS62464.2025.112016762025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands
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Reconfigurable AlScN FBAR Resonators and Filters Enabled by Ferroelectric SwitchingWenzheng Jiang, Xuanqi Huang, Chen Li, Ruidong Qin, Wentong Dou, Chongyang Huo, Bozuo Jing, Yiying Wang, Zhiqiang Mu, Wenjie Yu2025, pp. 1-3. https://doi.org/10.1109/IUS62464.2025.112016582025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands
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Enhanced Performance of 16.8 GHz BAW Resonators Using Polarity-Inverted Piezoelectric Film Stack ArchitectureWentong Dou, Xuanqi Huang, Chen Li, Ruidong Qin, Chongyang Huo, Yang Gao, Zhiqiang Mu, Wenjie Yu2025, pp. 1-3. https://doi.org/10.1109/IUS62464.2025.112017362025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands
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Multi-state Switching of Ferroelectric AlScN FBAR via Dynamic Waveform ModulationBozuo Jing, Ruidong Qin, Chen Li, Chongyang Huo, Wentong Dou, Yiying Wang, Xuanqi Huang, Zhiqiang Mu, Wenjie Yu2025, pp. 1-3. https://doi.org/10.1109/IUS62464.2025.112015992025 IEEE International Ultrasonics Symposium (IUS), Utrecht, Netherlands
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Advancements in Super-High Frequency Al(Sc)N BAW Resonators for 5G and BeyondChen Li, Ruidong Qin, Wentong Dou, Chongyang Huo, Xuanqi Huang*, Zhiqiang Mu*, Weimin Li and Wenjie Yu -
Mitigating Band Tail Effects by Electrostatic Doping in SOI Hybrid Gate MOSFETsYuxin Liu, Qiang Liu, Jin Chen, Huiqin Yu, Jia Huang, Wenjie Yuvol. 46, no. 10, pp. 1677-1680, Oct. 2025 https://doi.org/10.1109/LED.2025.3600175IEEE Electron Device Letters
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Mechanistic Analysis of the Effect of Gap on Convex Curves of Wafer in Double-Sided PolishingJiayu Chen, Yiran Liu, Xiangang Wang, Jun Cao, Wenjie Yu, Lei Zhuvol. 38, no. 3, pp. 571-578, Aug. 2025 https://doi.org/10.1109/TSM.2025.3574490IEEE Transactions on Semiconductor Manufacturing
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Total Ionizing Dose Hardening Methodology in Back Gate Embedded SOI MOSFETs with Ultrathin Buried OxideYuxin Liu, Qiang Liu, Jin Chen, Wenjie Yuvol. 46, no. 9, pp. 1465-1468, Sept. 2025 https://doi.org/10.1109/LED.2025.3587666IEEE Electron Device Letters
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A Novel Approsch for Large-Scale Fabrication of Nanoscale Vacuum Electronic Devices with High Compatibility and ControllabilityJin Chen, Qiang Liu, Yuxin Liu, Wenjie Yuvol. 46, no. 8, pp. 1397-1400, Aug. 2025 https://doi.org/10.1109/LED.2025.3580064IEEE Electron Device Letters
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（期刊封面论文）A multi-channel wearable sensing patch based on gate-all-around field-effect transistorsZhe Xing‡, Qiang Liu‡, Bo Lin, Shuang Li, Yuxin Liu, Guanyang Zhang, Wenjie Yu, Zhenhua Wu*, Hongju Mao* -
Unified multimodal multidomain polymer representation for property predictionQi Huang, Yedi Li, Lei Zhu, Qibin Zhao, Wenjie Yu -
Hierarchical Deep Potential with Structure Constraints for Efficient Coarse-Grained ModelingQi Huang, Yedi Li, Lei Zhu*, and Wenjie Yu2025, 65(7), pp.3203-3214. https://doi.org/10.1021/acs.jcim.4c02042Journal of Chemical Information and Modeling
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Superconformal Electrodeposition of Cobalt into Micron-Scale Trench with Alkynol DerivativesWei Xu, Yedi Li, Tingjun Wu *, Yu Duan, Lei Zhu, Qiang Liu, Yiying Wang, Wenjie Yu -
Effects of Heteroaromatic Thiol Additives on Co Electrodeposition by Surface AdsorptionYu Duan, Yedi Li, Tingjun Wu *, Wei Xu, Lei Zhu, Qiang Liu, Yiying Wang, Wenjie Yu -
A Novel Approach to Integrating Thermal Performance and Total Ionizing Dose Hardening in Void Embedded Silicon-on-insulator MOSFETJin Chen, Qiang Liu*, Yuxin Liu, Zhiqiang Mu, Xing Wei, Wenjie Yu*