Paper

Novel Void Embedded Design for Total Ionizing Dose Hardening of Silicon-on-Insulator MOSFET
Qiang Liu, Hongyang Zhou, Xin Jia, Yumeng Yang, Zhiqiang Mu, Xing Wei, Wenjie Yu

IEEE Electron Device Letters
2022, 43(11): 1814-1817. https://doi.org/10.1109/LED.2022.3211404
Study on the Scandium-Doped AlN Films and HBAR Devices
Yubo Zhu, Zhiqiang Mu, Lingli Chen, Lei Zhu, Weimin Li, Wenjie Yu

Piezoelectrics & Acoustooptics
2022, 44(2):299-303309. http://lib.cqvip.com/Qikan/Article/Detail?id=7107129145